Interface Charge Trap Density of Solution Processed Ferroelectric Gate Thin Film Transistor Using ITO/PZT/Pt Structure
http://repository.vnu.edu.vn/handle/VNU_123/33013
| Title: | Interface Charge Trap Density of Solution Processed Ferroelectric Gate Thin Film Transistor Using ITO/PZT/Pt Structure |
| Authors: | Pham, Van Thanh Bui, Nguyen Quoc Trinh Miyasako, Takaaki |
| Keywords: | Ferroelectric;Metal-ferroelectric-semiconductor;Indium-tin oxide (ITO);Ferroelectric gate thin film transistor (FGT);Conductance method |
| Issue Date: | 2013 |
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